A Mathematical Model for Grain Growth in Thin Metallic Films
نویسنده
چکیده
We use geometrical arguments based on grain boundary symmetries to introduce crystalline interfacial energies for interfaces in polycrystalline thin lms with a cubic lattice. These crystalline energies are incorporated into a multi{phase eld model. Our aim is to apply the multi{phase eld method to describe the evolution of faceted grain boundary triple junctions in epitaxially growing microstructures. In particular, we are interested in symmetry properties of triple junctions in tricrystalline thin lms. Symmetries of triple junctions in tricrystalline lms have been studied in experiments by Dahmen and Thangaraj 6;25. In accordance with their experiments, we nd in numerical simulations that any two neighbouring triple junctions belong to diierent symmetry classes. We introduce a local equilibrium condition at triple junctions which can be interpreted as a crystalline version of Young's law. The local equilibrium condition at triple junctions is purely determined by the grain boundary energies. In particular no triple junction energies are necessary to explain which triple junctions are possible. All triple junctions observed in the experiments as well as in the simulations fulll the crystalline version of Young's law. Our approach is also capable to describe grain boundary motion in general polycrystalline thin lms.
منابع مشابه
Positron Annihilation Study on Nanocrystalline Copper Thin Films Doped with Nitrogen
In the last decade a strong development in the nanomaterials field has been observed due to the unique and specific mechanical and physical properties of these nanomaterials comparatively to their coarser grain size materials [1–3]. On the other hand, thin metallic films play also an important role in many areas of the electronic industry for different applications, such as protective coatings ...
متن کاملGrain growth and the puzzle of its stagnation in thin films: The curious tale of a tail and an ear
The underlying cause of stagnation of grain growth in thin metallic films remains a puzzle. Here it is re-visited by means of detailed comparison of experiments and simulations, using a broad range of metrics that, in addition to grain size, includes the number of sides and the average side class of nearest neighbors. The experimental grain size data reported is large and comprises nearly 35,00...
متن کاملOPTICAL PROPERTIES OF THIN Cu FILMS AS A FUNCTION OF SUBSTRATE TEMPERATURE
Copper films (250 nm) deposited on glass substrates, at different substrate temperatures. Their optical properties were measured by ellipsometery (single wavelength of 589.3 nm) and spectrophotometery in the spectral range of 200–2600 nm. Kramers Kronig method was used for the analysis of the reflectivity curves of Cu films to obtain the optical constants of the films, while ellipsometery measu...
متن کاملGrowth, Characterization of Cu Nanoparticles Thin Film by Nd: YAG Laser Pulses Deposition
We report the growth and characterization of Cu nanoparticles thin film of on glass substrate by pulse laser deposition method. The Cu thin film prepared with different energy 50, 60, 70, and 80 mJ. The energy effect on the morphological, structural and optical properties were studied by AFM, XRD and UV-Visible spectrophotometer. Surface topography studied by atomic force microscopy revealed na...
متن کاملEpitaxially influenced boundary layer model for size effect in thin metallic films
It is shown that the size effect recently observed by Espinosa et al., fJ. Mech. Phys. Solids 51, 47 s2003dg in pure tension tests on free thin metallic films can be explained by the existence of a boundary layer of fixed thickness, located at the surface of the film that was attached onto the substrate during deposition. The boundary layer is influenced by the epitaxial effects of crystal grow...
متن کامل